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DE-Alarm
An Intelligent Yield and Quality Anomaly Detection and Alarming System

Overview

The Semitronix DE-ALARM is based on big data system that collects and cleans data from various sources. It provides real-time or near-real-time alerts on yield, parametric, and quality issues across WAT, CP, FT, and SLT stages, with the ability to integrate with ERP/MES systems. It's a vital system to guard the product quality, prevent defective parts from shipping to the customers, cutting costs on returns, exchanges, scraps, reworks, and delays—ultimately saving millions of dollars.

DE-ALARM minimizes customer complaints, protects brand reputation, and builds customer trust, a key driver of business success.

Advantages

Detection and Prevention

  • Real-time/Near real-time detection of yield/quality anomalies
  • Immediate actions on anomalies to prevent loss and protect brand reputation

Alarm Engine

  • Stable and efficient 24/7 operation with every single chip monitored
  • Support for integrating with MES/CIM systems to process each alarm in a closed loop without any omissions

Architecture

Features

Comprehensive Alarm Rule Setup

Various yield/bin/parametric statistical rules (e.g. Site or Zonal Gap, Wafer Pattern)

Various data quality verification rules (e.g. Duplicated ECID, Piggyback, Map Shift)

Validity and Accuracy of Alarm Rules

Visualized approval tree

Simulation on Alarm Triggered Failures

Support for optimizing rule criteria to prevent alarm detection failures

Balance between loose criteria and tight criteria to prevent monitoring failures and excessive false alarms

Rapid Analysis of Alarm Impact

A rapidly generated summary report for checking clustering

An alarm-triggering dashboard for root causes identification

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