中国·金年金字招牌诚信至上(股份)有限公司

Test Chip EDA&IP
- SmtCell Powerful Parameterized Cell Layout Design Platform
- TCMagic Conventional Testchip Layout Automation Design Platform
- ATCompiler Addressable Testchip Layout Automation Design Platform
- Addressable IP Addressable Test Chip
- ICSpider Automated Tool to Design Product-based Testchips
- Dense Array Ultra-high-density Testchip
- HDYS High Density Yield Scribeline
Data Analytics
- DE-G General Semiconductor Data Analysis
- DE-YMS Fab Inline and Yield Data Analysis
- DE-DMS Defect Management Analysis System
- INF-AI One-stop AI Solution Platform for Semiconductor Manufacture
- INF-ADC Automatic Defect Classification System
- INF-WPA An Intelligent and Efficient Platform for Wafer Pattern Analysis
- DE-RF RF Data Analysis Software
- DE-FDC Equipment Monitoring System
- DE-SPC Statistical Process Control System
- DE-Alarm An Intelligent Yield and Quality Anomaly Detection and Alarming System
- DE-iCASE AI Empowered Defect Analysis/ Case Tracking System Platform
DFM Software
- CMPEXP Efficient CMP Modeling and Simulation Tool
- Virtual Yield Chip Yield Modeling Tool
DFT Software
- DFTEXP Design for Testing Automation & Yield Diagnostics