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DE-G
General Semiconductor Data Analysis
Overview
DataExp-General (DE-G) is a simple, fast, and flexible general-purpose data analysis software for semiconductors. Through rich data visualization, flexible data interaction,data processing algorithms, together with data parsing and graphical presentation functions tailored for semiconductor analysis, DataExp-General helps users examine all dimensions of data and identify the root causes of problems in a shorter period.
Main Features
Easy operation. Supports import of multiple file types: .csv / .xls / .xlsx / .ad3 / .ad5 /. stdf /. std.
Powerful plotting Rich legend and graphs. Complete data visualization for each analysis scenario quickly.
Flexible data filtering. Easily filter out target data from massive amounts of data.
Fast and comprehensive data cleaning. Quickly filter noisy data such as outlier data, wrong data, and missing data.
Rich statistical analysis tools. Includes DOE analysis tools such as multiple regression distribution fitting, ANOVA, Chi-Square, etc., which are commonly used in the semiconductor field.
Professional semiconductor data analysis module. Built-in professional semiconductor analysis module, covering the industry's common analysis needs such as Wafermap, Device corner, COF/SOF analysis, Defect analysis, etc.
Powerful data graphical interaction. The dashboard achieves real-time interaction across graphical data, greatly improving data analysis performance and locating anomalies.
Flexible graphic layout. The charts can be custom arranged according to requirements, so that users can quickly compare the performance of various combinations, and also facilitate the writing of analysis reports.
User Template preservation. The analysis process is templated to help users quickly recall the completed analysis process and share it with other engineers or to refresh the data to automatically repeat the graphing.
Support Scripting. Support for reading data files or creating data tables using Python scripts, users can convert or model the data as required, and the newly generated data tables can be drawn directly.
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