DataExp-YMS (DE-YMS) supports intelligent analysis of CP, FT, WAT, Inline, Defect, WIP and other types of data in the IC manufacturing process, providing customers with a "one-stop" data analysis and management platform. With the unique algorithm support and logical data processing process, the system can quickly complete the cleaning, connection and integration of the underlying data, providing data management, yield analysis and low yield cause drill-down analysis for Fab and Fabless enterprises. At the same time, DE-YMS is based on distributed database and has a friendly interface for using tools, providing customers with a quick page for effective access and integration of massive data, as well as convenient and flexible interactive analysis services. It realizes the unified management of data resources and the intuitive expression of chip yield rate, which greatly improves the efficiency of engineers.