Main Features
INF-ADC
Automatic Defect Classification System
Overview
As IC manufacturing processes grow more complex, manual defect classification can no longer keep pace with industry demands. By leveraging high-performance GPUs, AI-assisted defect classification and signature detection methods have been introduced to greatly reduce costs and speed up yield enhancement.
Based on AI technologies, like image classification and computer vision, Semitronix offers a comprehensive solution called INF-ADC to automatically classify defects that are generated in different steps and equipment during the wafer manufacturing processes. INF-ADC provides an intuitive user interface and does not require machine leaning expertise. Users can develop and apply ADC models by using INF-ADC without a single line of code.
Based on AI technologies, like image classification and computer vision, Semitronix offers a comprehensive solution called INF-ADC to automatically classify defects that are generated in different steps and equipment during the wafer manufacturing processes. INF-ADC provides an intuitive user interface and does not require machine leaning expertise. Users can develop and apply ADC models by using INF-ADC without a single line of code.
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Advantages
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Ease of use:
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Wide range of applications:
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High classification accuracy:
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High system performance:
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