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Automotive Electronics
Improves Car Quality and Reduces Breakdown Risk

Overview

Modern automobiles increasingly rely on a variety of electronic components, such as engine control units, security systems, entertainment systems, etc. The industry has very high requirements for product quality and safety, and an increase in chip yield can help ensure the stability and reliability of electronic components, reduce the risk of failure, and improve the overall quality of the car.

Semitronix ' Wafer-Level Reliability Testing Solution

Semitronix' wafer-level reliability testing equipment has high hardware stability, measurement accuracy, and efficiency, enabling parallel testing. Furthermore, it can be integrated with Semitronix' custom software system to support a variety of reliability testing needs for chips, including high voltage, high current, long-term, and high-low temperature testing. Throughout the research, design, and manufacturing process, it simulates working environments to ensure high quality and reliability.

Data Analytics

Automotive electronics data analysis, management, and traceability

  • SPAT (Static Part Average Testing)
  • DPAT (Dynamic Part Average Testing)
  • AEC DPAT (Automotive Electronics Council Dynamic Part Average)
  • NNR (Nearest Neighbor Residual)

Automotive DFT

  • In-System-Test
    IST Controller and LBIST Controller Insertion
    DMA Mode IST Integration to Support Power Self-test
    CPU Interface IST Integration to Support Periodic Self-test
    IST+MBIST+LBIST Verification
     
  • Low DPPM solution
    Automotive Level ATPG
    User Defined MBIST Algorithm
    High Coverage Implementation( Scan Structure + Testpoint)

     

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