Key Components
Significant advantages of Semitronix solution
- Compared to traditional PCM, Semitronix solution offers stronger process monitors to achieve more robust production yield, stability and predictability
- Maintain production quality with reduced cost
Design

- Addressable solution significantly improves design efficiency
- High accuracy/High reliability
Related products:ATCompiler Dense Array
Types of Test Chip | Single DUT Size | Improvement of Field Size |
---|---|---|
Traditional test chip | 15000μm2 | / |
Addressable test chip | 625μm2 | 10~30X |
Ultra-high dense array | 10μm2 | >1500X |
Testing

- Test acceleration: 1.4X to 5X WPH
- Production EAP system integration
- Data matched to foundry requirements
- Field proven for production application at leading foundries
Related products:WAT Tester
Types of Test Chip | Baseline Tester | Semitronix Tester |
---|---|---|
Traditional test chip | 1X | 1.4~5X |
Addressable test chip | 1X | 3~10X |
Ultra-high dense array | 1X | 100~1000X |
Data Analysis

- DataExp facilitates analytics flow automation, standardized with integrated back-end production databases.
- In-depth analysis from traditional individual parameter control to exploring insights and actionable feedback from multi-dimensional data sources.
Related products: DataExp-General DataExp-YMS