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Process Control Monitor
Improve electrical monitoring efficiency of design, testing and analysis for high quality mass production

Key Factors of Mass Production Management

Enhanced process control
· Comprehensive monitor of process variations and drifts
· Establish product-by-product process sensitivity links


High quality feedback
· Early detection to drive timely response
· Pinpoint root cause to minimize risks and impacts
Cost reduction
· Reduce PCM area requirements
· Reduce WAT test cost

Key Components

Significant advantages of Semitronix solution

 

  • Compared to traditional PCM, Semitronix solution offers stronger process monitors to achieve more robust production yield, stability and predictability
  • Maintain production quality with reduced cost

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Design

  • Addressable solution significantly improves design efficiency
  • High accuracy/High reliability

Related products:ATCompiler   Dense Array 

 

Types of Test Chip Single DUT Size Improvement of Field Size
Traditional test chip 15000μm2 /
 Addressable test chip 625μm2 10~30X
  Ultra-high dense array 10μm2 >1500X

 

Testing

  • Test acceleration: 1.4X to 5X WPH
  • Production EAP system integration
  • Data matched to foundry requirements
  • Field proven for production application at leading foundries

Related productsWAT Tester

 

Types of Test Chip  Baseline Tester Semitronix Tester
Traditional test chip 1X 1.4~5X
Addressable test chip 1X 3~10X
Ultra-high dense array 1X 100~1000X

Data Analysis

  • DataExp facilitates analytics flow automation, standardized with integrated back-end production databases.
  • In-depth analysis from traditional individual parameter control to exploring insights and actionable feedback from multi-dimensional data sources.

Related products: DataExp-General   DataExp-YMS

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